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PIPS II

Gatan Inc.

PIPS II

Precision ion polishing system for precise centering, control, and reproducibility of your milling process.

Pecs II

Gatan Inc.

PECS II

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.

Ilion II

Gatan Inc.

Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing.

Solarus II

Gatan Inc.

Solarus II Plasma Cleaner

The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders.

Dimple Grinder II

Gatan Inc.

Dimple Grinder II

Fast and reliable mechanical method of pre-thinning to near electron transparency to greatly reduce your ion milling times and uneven thinning.

Disc Punch

Gatan Inc.

Disc Punch

Preferred method for cutting transmission electron microscope (TEM) discs from metals, alloys, and all ductile materials.

Disc Grinder

Gatan Inc.

Disc Grinder

Pre-thin and polish your samples to reduce ion milling times and improve quality.

Ultrasonic Cutter

Gatan Inc.

Ultrasonic Cutter

Cut your brittle materials beyond the 3 mm transmission electron microscope (TEM) disc to accurately cut holes or unique shapes.

Cross Section Kit

Gatan Inc.

Cross Section Kit

Ideal for preparing cross sectional transmission electron microscopy (XTEM) samples of semiconductor devices, thin films of various substrates, and composites.

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“We’ve been sourcing our lab instruments from them, and the quality and reliability are unmatched. Truly a trusted partner for any scientific setup.”

Prof. Sushil Mishra

Mechanical Eng., IIT Bombay

“Excellent range of equipment and outstanding service! The team understands our technical needs perfectly and always delivers on time. Highly professional and dependable.”

Dr. Hitesh Mehtani

R&D JSW Steel Ltd.

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